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Scanning near-field optical microscope:systems designs,performance specifications,and standardization schemes

Author(s):
Lim,T.-K. ( Nanyang Technological Univ. )  
Publication title:
Optical devices and diagnostics in materials science, 1-4 August 2000, San Diego, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4098
Pub. Year:
2000
Page(from):
121
Page(to):
124
Pub. info.:
Bellingham, Wash., USA: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819437433 [0819437433]
Language:
English
Call no.:
P63600/4098
Type:
Conference Proceedings

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