Impact of optical enhancement techniques on the mask error enhancement function(MEEF)
- Author(s):
- Plat,M.V. ( Advanced Micro Devices,Inc. )
- Nguyen,K.B.
- Spence,C.A.
- Lyons,C.F.
- Wilkison,A.
- Publication title:
- Optical microlithography XIII : 1-3 March 2000, Santa Clara, USA
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4000
- Pub. Year:
- 2000
- Vol.:
- Part1
- Page(from):
- 206
- Page(to):
- 214
- Pub. info.:
- Bellingham, Wash., USA: SPIE - The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819436184 [0819436186]
- Language:
- English
- Call no.:
- P63600/4000
- Type:
- Conference Proceedings
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