Blank Cover Image

*In situ measurements of stress relazation during strained layer heteroepitaxy

Author(s):
Chason, E.
Yin, J.
Tetz, K.
Beresford, R.
Freund, L. B.
Gonzalez, M. Ujue
Floro, J. A.
2 more
Publication title:
Self-organized processes in semiconductor alloys : symposium held November 29-December 2, 1999 Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
583
Pub. Year:
2000
Page(from):
167
Pub. info.:
Warrendale, Pa.: MRS-Materials Research Society
ISSN:
02729172
ISBN:
9781558994911 [1558994912]
Language:
English
Call no.:
M23500/583
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Measurements of Stress Evolution During Thin Film Deposition

Chason, E., Floro, J. A.

MRS - Materials Research Society
7 Conference Proceedings Real Time Measurement of Epilayer Strain Using a Simplified Wafer Curvature Technique

Floro, J. A., Chason, E., Lee, S. R.

MRS - Materials Research Society
2 Conference Proceedings Measurements of Stress Evolution During Thin Film Deposition

Chason, E., Floro, J. A.

MRS - Materials Research Society
8 Conference Proceedings Three-Dimensional Numerical Simulation of Interacting Dislocations in a Strained Epitaxial Surface Layer

Kukta, R. V., Freund, L. B.

MRS - Materials Research Society
3 Conference Proceedings Size and Critical Thickness Evolution During Growth of Stacked Layers of InAs/InP(001) Quantum Wires Studied by In Situ Stress Measurements

Fuster, David, Gonzalez, Maria Ujue, Gonzalez, Luisa, Gonzalez, Yalanda, Ben, Teresa, Ponce, Arturo, Molina, Sergio I.

Materials Research Society
9 Conference Proceedings MECHANICS OF ELASTIC DISLOCATIONS IN STRAINED LAYER STRUCTURE

Freund, L.B., Bower, A., Ramirez, J.C.

Materials Research Society
4 Conference Proceedings Smoothing During Ion-Assisted Growth by Transient Ion Beam-Induced Defects

Kellerman, B. K., Chason, E., Floro, J. A., Picraux, S. T., White, J. M.

MRS - Materials Research Society
10 Conference Proceedings Measurement of Stress in Phosphated-Iron Oxide Layers by In-Situ Diffraction of Synchrotron Radiation

Panicaud, B., Renault, P.-O., Grosseau-Poussard, J.L., Dinhut, J.F., Thiaudiere, D., Gailhanou, M.

Trans Tech Publications
5 Conference Proceedings INTRA-CASCADE SURFACE RECOMBINATION OF POINT DEFECTS DURING ION BOMBARDMENT OF Ge (001)

Floro, J. A., Kellerman, B. K., Chason, E., Picraux, S. T., Brice, D. K., Horn, K. M.

MRS - Materials Research Society
11 Conference Proceedings Heteroepitaxy of GaN on Silicon: In Situ Measurements

Krost, A., Dadgar, A., Schulze, F., Clos, R., Haberland, K., Zettler, T.

Trans Tech Publications
6 Conference Proceedings Real Time Measurement of Epilayer Strain Using Simplified Water Curvature Technique

Floro, J. A., Chason, E., Lee, S, R.

MRS - Materials Research Society
12 Conference Proceedings Calculation of Equilibrium Island Morphologies for Strained Epitaxial Systems

Kukta, R. V., Freund, L. B.

MRS - Materials Research Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12