Blank Cover Image

Effect of Pb excess content on microstructure and electrical properties of Sil Gel derived PZT thin films

Author(s):
Publication title:
Ferroelectric thin films VIII : symposium held November 29-December 2, 1999, Boston, Massachusetts, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
596
Pub. Year:
2000
Page(from):
229
Pub. info.:
Warrendale, PA: MRS-Materials Research Society
ISSN:
02729172
ISBN:
9781558995048 [1558995048]
Language:
English
Call no.:
M23500/596
Type:
Conference Proceedings

Similar Items:

Wang,Z., Maeda,R., Kikuchi,K.M.

SPIE - The International Society for Optical Engineering

Zhang, L., Ichiki, M., Wang, Z.-J., Maeda, R.

SPIE-The International Society for Optical Engineering

Nakano, K., Sakai, G., Shimanoe, K., Yamazoe, N.

Electrochemical Society

Zhao, C. L., Wang, Z. H., Zhu, W., Tan, O. K., Hng, H. H.

Materials Research Society

Teowee, G., Boulton, J.M., Uhlmann, D.R.

Materials Research Society

Chen,Y.-C., Wang,C.-M., Kao,M.-C., Lai,Y.-H.

SPIE-The International Society for Optical Engineering

Kim, Seung-Hyun, Hong, J. G., Gunter, J. C., Lee, H. Y., Streiffer, S. K., Kingon, Angus I.

MRS - Materials Research Society

Du, W., Lu, W., Cheng, J., Meng, Z.

SPIE - The International Society of Optical Engineering

Myers, S.A., Myers, E.R.

Materials Research Society

Schwartz, Robert W., Dimos, D., Lockwood, S. J., Torres, V. M.

MRS - Materials Research Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12