Kratz, K.-L., Gabelmann, H., Ziegert, W., Harms, V., Krumlinde, J., Moller, P.
American Chemical Society
|
Hickman P. A., Huestis L. D., Saxon P. R.
Plenum Press
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Kratz -L. F., Hillebrandt W., Krumlinde J., Moller P., Thielemann -K. F., Wiescher M., Ziegert W.
D. Reidel Publishing Company
|
Xu,L., Zhang,G., Ding,J., Takamura,T.
SPIE-The International Society for Optical Engineering
|
Meyer, B. S., Howard, W. M., Mathews, G. J., Moller, P., Takahashi, K.
American Chemical Society
|
Cohen, L., Loughlin, P.J.
SPIE - The International Society of Optical Engineering
|
Huyse, M., Coenen, E., Deneffe, K., Duppen, P. Van, Wood, J. L.
American Chemical Society
|
Struck, L. M., Eng, J., Jr., Bent, B. E., Chabal, Y. J., Williams, G. P., White, A. E., Christman, S., Chaban, E. E., …
MRS - Materials Research Society
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Kratz L. K., Gabelmann H., Moller P., Pfeiffer B., Ravn L. H., Wohr A., Thielemann -K. F.
Plenum Press
|
Bates, C.A., Dunn, J.L., Oliete, P.B., Stedman, G.E.
Kluwer Academic Publishers
|
Mlekodaj, R. L., Braga, R. A., Kern, B. D., Leander, G. A., Toth, K. S., Gnade, B.
American Chemical Society
|
Unnikrishnan,G., Joseph,J., Singh,K.
SPIE - The International Society for Optical Engineering
|