Blank Cover Image

THE INFLUENCE OF MECHANICAL STRESS ON HOT-CARRIER DEGRADATION IN MOSFET'S

Author(s):
Publication title:
Thin films : stresses and mechanical properties IV : symposium held April 12-16, 1993, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
308
Pub. Year:
1993
Page(from):
349
Pub. info.:
Pittsburgh, Pa.: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558992047 [1558992049]
Language:
English
Call no.:
M23500/308
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings THE INFLUENCE OF MECHANICAL STRESS ON HOT-CARRIER DEGRADATION IN MOSFET'S

Wolf, Ingrid De, Bellens, Rudi, Groeseneken, Guido, Maes, Herman E.

MRS - Materials Research Society
7 Conference Proceedings Hot carrier degradation of fully depleted SIMOX MOSFETs

Sinha, S P, Ii, F D, loonnou, D E, Jenkins, W C, Hughes, H L, Lin, M S

Electrochemical Society
2 Conference Proceedings VARIATION OF LOCAL MECHANICAL STRESS DURING THE DIFFERENT PROCESSING STEPS OF IC-ISOLATION: A MICRO-RAMAN SPECTROSCOPY STUDY

Wolf, Ingrid De, Maes, Herman E., Norstrom, Hans

MRS - Materials Research Society
8 Conference Proceedings Channel Hot Carrier Stress of Oxynitrided-Gate MOSFETs

Nguyen, K., Lee, S., Kahrizi, M., Landsberger, L., Belkouch, S., Jean, C.

Electrochemical Society
3 Conference Proceedings NON-DESTRUCTIVE ASSESSMENT OF THIN FILM STRESSES AND CRYSTAL QUALITY OF SILICON ON INSULATOR MATERIALS WITH RAMAN SPECTROSCOPY

De Wolf, Ingrid, Vanhellemont, Jan, Maes, Herman E.

Materials Research Society
9 Conference Proceedings Phase and Mechanical Stress in and Surrounding TiSi2 and CoSi2 Lines Studied by Micro-Raman Spectroscopy

Wolf, I. De, Howard, D. J., Maex, K., Maes, H. E.

MRS - Materials Research Society
4 Conference Proceedings Hot Carrier Stress and Breakdown Impact on High-frequency MOSFET Analog Performance

Pantisano, L., Schreurs, D., Kaczer, B., Simoen, E., Groeseneken, G.

Electrochemical Society
10 Conference Proceedings Gate-to Drain Capacitance as a Monitor for Hot-Carrier Degradation in Sbmictometer MOSFETs

Ling, C.H.

Electrochemical Society
5 Conference Proceedings The Enhanced Degradation of MOSFETs Damaged by Hot Holes

Al-Kohafi, I.S., Zhang, J.F., Groeseneken, G.

Electrochemical Society
11 Conference Proceedings Raman Spectroscopy: A unique Tool for the Study of Thin Films

De Wolf, Ingrid

Materials Research Society
6 Conference Proceedings Methods to Measure Mechanical Properties of NEMS and MEMS: Challenges and Pitfalls

Ingrid De Wolf, Stanislaw Kalicinski, Jeroen De Coster, Herman Oprins

Materials Research Society
12 Conference Proceedings Residual Stresses in Tungsten Lines: Analysis of Experimental- (Micro-Raman Spectroscopy, XRD) and Numerical Results

Wolf, I. De, Maes, H. E., Moffet, J., Ignat, M.

MRS - Materials Research Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12