Critical Issues in Measuring the Mechanical Properties of Hard Films on Soft Substrates by Nanoindentation Techniques

Critical Issues in Measuring the Mechanical Properties of Hard Films on Soft Substrates by Nanoindentation Techniques

Author(s):

Publication title:

Thin-films : stresses and mechanical properties VII : symposium held December 1-5, 1997, Boston, Massachusetts, U.S.A.

Title of ser.:

Materials Research Society symposium proceedings

Ser. no.:

505

Pub. Year:

1998

Page(from):

65

Pub. info.:

Warrendale, Pa.: MRS - Materials Research Society

ISSN:

02729172

ISBN:

9781558994102 [1558994106]

Language:

English

Call no.:

M23500/505

Type:

Conference Proceedings

Details

TDL ID:	ZA00019380
Series ID:	PA00000011
Conf. info. (Name):	Symposium on thin-films-stresses and mechanical properties
Conf. info. (Number):	7th
Conf. info. (Venue):	Boston, MA, USA
Conf. info. (Date):	1997.12.01-1997.12.05

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