Monochromators for small cross-section x-ray beams from high heat flux synchrotron sources
- Author(s):
- Ice,G.E. ( Oak Ridge National Lab. )
- Riemer,B.
- Khounsary,A.M.
- Publication title:
- Optics for high-brightness synchrotron radiation beamlines II : 6-7 August 1996, Denver, Colorado
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 2856
- Pub. Year:
- 1996
- Page(from):
- 226
- Page(to):
- 235
- Pub. info.:
- Bellingham, WA: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819422446 [0819422444]
- Language:
- English
- Call no.:
- P63600/2856
- Type:
- Conference Proceedings
Similar Items:
1
Conference Proceedings
Monochromators for small-cross-section x-ray beams from high heat flux synchrotron sources
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
10
Conference Proceedings
Advanced Photon Source undulator beamline tests of a contact-cooled silicon u-shaped monochromator
SPIE-The International Society for Optical Engineering |
5
Conference Proceedings
Thermal management of next-generation contact-cooled synchrotron x-ray mirrors
SPIE - The International Society for Optical Engineering |
11
Conference Proceedings
Heat load studies of a water-cooled minichannel monochromator for synchrotron x-ray beams
SPIE-The International Society for Optical Engineering |
6
Conference Proceedings
Experimental results with cryogenically cooled thin silicon crystal x-ray monochromators on high heat flux beamlines
SPIE-The International Society for Optical Engineering |
12
Conference Proceedings
Synchrotron White Beam X-Ray Topography and High Resolution Triple Axis X-Ray Diffraction Studies of Defects in SiC Substrates, Epilayers and Devices
Trans Tech Publications |