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Considerations for a soft x-ray spectromicroscopy beamline

Author(s):
Winn,B. ( SUNY/Stony Brook )
Hao,X.
Jacobsen,C.J.
Kirz,J.
Miao,J.
Wirick,S.
Ade,H.
Buckley,C.J.
Howells,M.R.
Hulbert,S.L.
McNulty,I.
Oversluizen,T.
7 more
Publication title:
Optics for high-brightness synchrotron radiation beamlines II : 6-7 August 1996, Denver, Colorado
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
2856
Pub. Year:
1996
Page(from):
100
Page(to):
109
Pub. info.:
Bellingham, WA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819422446 [0819422444]
Language:
English
Call no.:
P63600/2856
Type:
Conference Proceedings

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