Near-UV to IR optical characterization of YF3 thin films deposited by evaporation and ion beam processes

Near-UV to IR optical characterization of YF3 thin films deposited by evaporation and ion beam processes

Author(s):

Quesnel,E. ( LETI/CEA/DOPT )

Publication title:

Developments in optical component coatings : 15-16 May, 1996, Glasgow, Scotland, UK

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

2776

Pub. Year:

1996

Page(from):

366

Page(to):

372

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819421616 [0819421618]

Language:

English

Call no.:

P63600/2776

Type:

Conference Proceedings

Details

TDL ID:	ZA00019336
Series ID:	PA00000029
Conf. info. (Name):	Optical Instrumentation & System Design : Developments in optical component coatings
Conf. info. (Number):	1996
Conf. info. (Venue):	Glasgow, Scotland, UK
Conf. info. (Date):	1996.05.15-1996.05.16

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