Confocal imaging through a dielectric interface:aberration modeling

Author(s):

• Sheppard,C.J.R. ( Univ.of Sydney )
• Torok,P.

Publication title:

Three-dimensional microscopy : image acquisition and processing III : 30 January-1 February 1996, San Jose, California

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

2655

Pub. Year:

1996

Page(from):

280

Page(to):

286

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819420299 [0819420298]

Language:

English

Call no.:

P63600/2655

Type:

Conference Proceedings