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Manfait M., Theophanides T., Alix P. J. A., Jeannesson P.
D. Reidel
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Grootendorst, E. J., Ponec, V.
Elsevier
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Kiefer W., Laane J.
D. Reidel Pub. Co.
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Wensel, R. W., Vernon, M. S., Penaloza, M., Cross, W. M., Winter, R. M., Kellar, J. J.
American Institute of Chemical Engineers
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Janchen, J., Haanepen, M. J., Peeters, M. P. J., Wolput, J. H. M. C. van, Wolthuizen, J. P., Hooff, J. H. C. van
Elsevier
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Thomas, A., Reilly, J.T., Reyes, A., Chong, C.Y., Douohue, M.D.
American Institute of Chemical Engineers
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Borowiec,M.T., Szymczak,H., Zateski,M., Kaczor,P., Adamowicz,L., Strzeszewski,J., Watterich,A., Kovacs,L.
SPIE - The International Society for Optical Engineering
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Baraton I. M., Merle-mejean T., Quintard P., Lorenzelli V.
Kluwer Academic Publishers
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Babkov, L. M., Vedyaeva, E. S., Trukhachev, S. V.
SPIE - The International Society of Optical Engineering
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Botman, M. J. P., Hartog, A. J. den, Ponec, V.
Elsevier
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Moon, S. -C., Yamashita, H., Anpo, M.
Elsevier
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