Blank Cover Image

Influence of dopant species on electron mobility in heavily doped semiconductors

Author(s):
Publication title:
Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997
Title of ser.:
Materials science forum
Ser. no.:
258-263
Pub. Year:
1997
Vol.:
Part2
Page(from):
939
Page(to):
944
Pub. info.:
Zurich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878497881 [0878497889]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

Similar Items:

E. Ungersboeck, V. Sverdlov, H. Kosina, S. Selberherr

Electrochemical Society

Ayalew, T., Grasser, T., Kosina, H., Selberherr, S.

Trans Tech Publications

V. A. Sverdlov, H. Kosina, S. Selberherr

Society of Photo-optical Instrumentation Engineers

K.V. Vasilevskiy, S.K. Roy, N. Wood, A.B. Horsfall, N.G. Wright

Trans Tech Publications

G. Karlowatz, E. Ungersboeck, H. Kosina, W. Wessner, S. Selberherr

Electrochemical Society

Liu, C., Hao, Q., Wang, H., Li, Y.X., Zhang, W., Xu, Y.

Electrochemical Society

H. Karner, A. Gehring, S. Holzer, H. Kosina, S. Selberherr

Electrochemical Society

10 Conference Proceedings Modeling of Advanced Semiconductor Devices

Enzo Ungersboeck, Viktor Sverdlov, Hans Kosina, Siegfried Selberherr

Electrochemical Society

Gritsch, M., Kosina, H., Grasser, T., Selberherr, S.

SPIE-The International Society for Optical Engineering

11 Conference Proceedings Numerical Analysis of Gate Stacks

M. Karner, S. Holzer, W. Goes, M. Vasicek, M. Wagner, H. Kosina, S. Selberherr

Electrochemical Society

Gritsch, M., Kosina, H., Grasser, T., Selberherr, S.

Electrochemical Society

HOFSASS,H., LINDNER,G., WINTER,S., BESOLD,B., RECK-NAGEL,E., WEYER,G., PETERSEN,J.W.

Trans Tech Publications

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12