Atomic Force Microscopy Study of Grain Evolution during Growth of Thin Oxide Films

Atomic Force Microscopy Study of Grain Evolution during Growth of Thin Oxide Films

Author(s):

Publication title:

Grain growth in polycrystalline materials II : proceedings of the 2nd International Conference on Grain Growth in Polycrystalline Materials, held in Kitakyushu, Japan, 17-20 May, 1995

Title of ser.:

Materials science forum

Ser. no.:

204-206

Pub. Year:

1996

Pt.:

2

Page(from):

729

Page(to):

734

Pub. info.:

Zurich-Uetikon, Switzerland: Trans Tech Publications

ISSN:

02555476

ISBN:

9780878497195 [0878497196]

Language:

English

Call no.:

M23650

Type:

Conference Proceedings

Details

TDL ID:	ZA00018825
Series ID:	PA00000012
Conf. info. (Name):	International Conference on Grain Growth in Polycrystalline Materials
Conf. info. (Number):	2nd
Conf. info. (Venue):	Kitakyushu, Japan
Conf. info. (Date):	1995.05.17-1995.05.20

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