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Thickness and density determination for Ni-C-Ni ultrathin film by photoemission and X-ray fluorescence measurements under total external reflection

Author(s):
Burattini,E.
Cappuccio,G.
Sessa,V.
Yu,I.
Kharitonov
Kovalchuk,M.V.
Novikova,N.N.
Sosphenov,A.N.
Zheludeva,S.I.
4 more
Publication title:
EPDIC 3 : proceedings of the Third European Powder Diffraction Conference, held September 25 - 28, 1993, in Vienna, Austria
Title of ser.:
Materials science forum
Ser. no.:
166-169
Pub. Year:
1994
Vol.:
Part2
Page(from):
337
Page(to):
342
Pub. info.:
Aedermannsdorf, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878496822 [0878496823]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

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