Blank Cover Image

The application of high resolution X-ray diffraction for the investigation of the process of elastic strain relaxation in InGaAs quantum well

Author(s):
Faleev,N.
Stabenow,R.
Sinitsyn,M.
Yavich,B.
Haase,A.
Grudsky,A.
1 more
Publication title:
EPDIC 3 : proceedings of the Third European Powder Diffraction Conference, held September 25 - 28, 1993, in Vienna, Austria
Title of ser.:
Materials science forum
Ser. no.:
166-169
Pub. Year:
1994
Vol.:
Part1
Page(from):
293
Page(to):
298
Pub. info.:
Aedermannsdorf, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878496822 [0878496823]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Advantageous Use of Glass Capillaries as Primary Optics for X-Ray Residual Stress Analyses and a Novel Concept for “Micro Diffraction” Stress Analysis

Eigenmann, B., Langhoff, N., Bjeoumikhov, A., Haase, A., Stabenow, R.

Trans Tech Publications
7 Conference Proceedings *STRUCTURAL PERFECTION OF InGaAs/InP SUPERLATTICES GROWN BY GAS SOURCE MOLECULAR BEAM EPITAXY: A HIGH-RESOLUTION X-RAY DIFFRACTION STUDY

vanderberg, J. M., Panish, M. B., Hamm,. R. A.

Materials Research Society
2 Conference Proceedings STRAIN RELAXATION IN EPITAXIAL HETEROSTRUCTURES: SENSITIVITY OF HIGH RESOLUTION X-RAY DIFFRACTION

Goorsky, M.S., Horng, S.T., Stiffler, S.R., Stanis, C.S.

Materials Research Society
8 Conference Proceedings A New Approach for Determining Epilayer Strain Relaxation and Composition through High Resolution X-ray Diffraction

Matney, K. M., Goorsky, M. S.

MRS - Materials Research Society
3 Conference Proceedings Investigation of inhomogeneous in-plane strain relaxation in Si/SiGe quantum wires by high resolution X-ray diffraction

Zhuang, Y., Schelling, C., Roch, T., Daniel, A., Schaffler, F., Bauer, G., Grenzer, J., Pietsch, U., Senz, S.

MRS-Materials Research Society
9 Conference Proceedings Crystalline Perfection of Epitaxial Structure: Correlations with Composition, Thickness, and Elastic Strain of Epitaxial Layers

Balakrishnam R. Jampana, Nikolai N. Faleev, Ian T. Ferguson, Robert L. Opila, Christiana B. Honsberg

Materials Research Society
4 Conference Proceedings Optimization of InGaAs/InAlAs strained multiple quantum wells for amplitude modulators

Pires, M.P., Tribuzy, C.V.-B., Yavich, B., Souza, P.L.

SPIE-The International Society for Optical Engineering
10 Conference Proceedings High Resolution Synchrotron X-ray Diffraction Tomography of Large-Grained Samples

Piotrowski, D. P., Stock, S. R., Guvenilir, A., Haase, J. D., Rek, Z. U.

MRS - Materials Research Society
5 Conference Proceedings High-resolution X-ray diffraction analysis of p-type strained InGaAs/AlGaAs multiple quantum well structures

Shi, W., Zhang, D. H., Osotchan, T., Zhang, P. H., Yoon, S. F., Swaminathan, S.

MRS-Materials Research Society
11 Conference Proceedings High Resolution XRD Studies of Ion Beam Irradiated InGaAs/InP Multi Quantum Wells

S. Dhamodaran, N. Sathish, Anand P. Pathak, Andrzej Turos, Devesh K. Avasthi, Brij M. Arora

Materials Research Society
6 Conference Proceedings Reliability and failure mode investigation of high-power multimode InGaAs strained quantum well single emitters

Y. Sin, B. Foran, N. Presser, M. Mason, S. C. Moss

SPIE - The International Society of Optical Engineering
12 Conference Proceedings Investigation of catastrophic degradation in high power multimode InGaAs strained quantum well single emitters

Y. Sin, N. Presser, B. Foran, S. C. Moss

Society of Photo-optical Instrumentation Engineers
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12