The Effect of grain-Speafic Texture on hillock Growth in Al-1%Si Films on SiO2/Si Substrates

The Effect of grain-Speafic Texture on hillock Growth in Al-1%Si Films on SiO2/Si Substrates

Author(s):

Publication title:

Recrystallization '92 : International Conference on Recrystallization and Related Phenomena, San Sebastian, Spain, August 31 - September 4, 1992

Title of ser.:

Materials science forum

Ser. no.:

113-115

Pub. Year:

1993

Page(from):

625

Page(to):

630

Pub. info.:

Aedermannsdorf: Trans Tech Publications

ISSN:

02555476

ISBN:

9780878496495 [0878496491]

Language:

English

Call no.:

M23650

Type:

Conference Proceedings

Details

TDL ID:	ZA00019284
Series ID:	PA00000012
Conf. info. (Name):	International Conference on Recrystallization and Related Phenomena
Conf. info. (Number):	1992
Conf. info. (Venue):	San Sebastian, Spain
Conf. info. (Date):	1992.08.31-1992.09.04

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