The Development of GrainSpeafic Texture and Grain Boundary Character during Grain Growth of Al-1%Si Films on SiO2/Si Substrates

The Development of GrainSpeafic Texture and Grain Boundary Character during Grain Growth of Al-1%Si Films on SiO2/Si Substrates

Author(s):

Publication title:

Recrystallization '92 : International Conference on Recrystallization and Related Phenomena, San Sebastian, Spain, August 31 - September 4, 1992

Title of ser.:

Materials science forum

Ser. no.:

113-115

Pub. Year:

1993

Page(from):

619

Page(to):

624

Pub. info.:

Aedermannsdorf: Trans Tech Publications

ISSN:

02555476

ISBN:

9780878496495 [0878496491]

Language:

English

Call no.:

M23650

Type:

Conference Proceedings

Details

TDL ID:	ZA00019284
Series ID:	PA00000012
Conf. info. (Name):	International Conference on Recrystallization and Related Phenomena
Conf. info. (Number):	1992
Conf. info. (Venue):	San Sebastian, Spain
Conf. info. (Date):	1992.08.31-1992.09.04

Similar Items:

1 Conference Proceedings The Effect of grain-Speafic Texture on hillock Growth in Al-1%Si Films on SiO2/Si Substrates Gerth,D., Schwarzer,R.A. Trans Tech Publications	7 Conference Proceedings Individual Grain Orientation Relations after High-Speed Hot Rolling of Steel Rods Barthel,M., Gerth,D., Schwarzer,R.A., Klimanek,P., Messerschmidt,U. Trans Tech Publications
2 Conference Proceedings Stress-Induced Grain Growth in Thin Al-1%Si Layers on SilSiO2 Substrates Gerth,D., Zaefferer,S., Schwarzer,R.A. Trans Tech Publications	8 Conference Proceedings Sensitivity of texture development during grain growth to anisotropy of grain boundary properties Rollet, A.D. Kluwer Academic Publishers
3 Conference Proceedings Correlation between Grain Growth and Hillock Growth in Thin Thermally Annealed Al-1 % Si Films on Silicon Substrates Gerth,D., Katzer,D., Schwarzer,R. Trans Tech Publications	9 Conference Proceedings Grain Boundary Character Evolution during Grain Growth in a Zr Alloy N. Bozzolo, G. Sawina, F. Gerspach, K. Sztwiertnia, A.D. Rollett, F. Wagner Trans Tech Publications
4 Conference Proceedings HVEM in Situ Investigation of Stress-Induced Grain Growth During Thermal Annealing of Thin Al-Alloy Films on a Si/SiO2 Substrate Katzer,D., Gerth,D., Riesenberg,R. Trans Tech Publications	10 Conference Proceedings The Influence of Texture and Grain Boundary Character Distribution on the Reliability of Aluminum Thin Films Lee,K.T., Szpunar,J.A., Knorr,D.B. Trans Tech Publications
5 Conference Proceedings Local Mechanical Properties in Thin Aluminium Layers on Silicon Substrates Calculated from Measured Grain Orientations Gerth,D., Schwarzer,R.A. Trans Tech Publications	11 Conference Proceedings Preparation of High-Resistance or Sensitive Samples for Grain Orientation Measurement with Electron Microscopes Schwarzer,R.A. Trans Tech Publications
6 Conference Proceedings Determination of Local Texture and Deformation Systems in TiAl6V4 and T40 Zaefferer,S., Gerth,D., Schwarzer,R.A. Trans Tech Publications	12 Conference Proceedings Growth Modes of SiO₂ Films on Polymeric Substrates G. Dennler, M.R. Wertheimer, A. Houdayer, P. Raynaud, I. Séguy, Y. Ségui Society of Vacuum Coaters

1

2

3

4

5

6

7

8

9

10

11

12