Interaction of a copper-induced defect with shallow acceptors and deep centers in silicon
- Author(s):
- Publication title:
- Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991
- Title of ser.:
- Materials science forum
- Ser. no.:
- 83-87
- Pub. Year:
- 1992
- Vol.:
- Pt.1
- Page(from):
- 167
- Page(to):
- 172
- Pub. info.:
- Zurich, Switzerland: Trans Tech Publications
- ISSN:
- 02555476
- ISBN:
- 9780878496280 [0878496289]
- Language:
- English
- Call no.:
- M23650
- Type:
- Conference Proceedings
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