Theoretical interpretation of EPR measurements on the iron-shallow acceptor pairs in silicon

Author(s):

• Assali,L.V.C.
• Leite,J.R.

Publication title:

Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991

Title of ser.:

Materials science forum

Ser. no.:

83-87

Pub. Year:

1992

Vol.:

Pt.1

Page(from):

143

Page(to):

148

Pub. info.:

Zurich, Switzerland: Trans Tech Publications

ISSN:

02555476

ISBN:

9780878496280 [0878496289]

Language:

English

Call no.:

M23650

Type:

Conference Proceedings