The influence of structure on dissolution inhibition for novolac-based photoresists: adaption of the probabilistic approach
- Author(s):
- McAdams, Christopher L. ( The University of Texas at Austin )
- Yueh, Wang
- Tsiartas, Pavlos
- Hsieh, Dale
- Willson, C. Grant
- Publication title:
- Micro- and nanopatterning polymers
- Title of ser.:
- ACS symposium series
- Ser. no.:
- 706
- Pub. Year:
- 1998
- Page(from):
- 292
- Page(to):
- 305
- Pub. info.:
- Washington, DC: American Chemical Society
- ISSN:
- 00976156
- ISBN:
- 9780841235816 [0841235813]
- Language:
- English
- Call no.:
- A05800/706
- Type:
- Conference Proceedings
Similar Items:
1
Conference Proceedings
Dissolution of phenolic polymers in aqueous base: the influence of polymer structure
SPIE-The International Society for Optical Engineering |
7
Conference Proceedings
Photoresist characterization for lithography simulation:III.Development parameter measurements
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
8
Conference Proceedings
Fundamental studies of the properties of photoresists based on resins containing polymerbound photoacid generators [6153-88]
SPIE - The International Society of Optical Engineering |
3
Conference Proceedings
Effect of molecular weight distribution on the dissolution properties of novolac blends
Society of Photo-optical Instrumentation Engineers |
SPIE-The International Society for Optical Engineering |
4
Conference Proceedings
Factors affecting the dissolution rate of novolac resins II:developer composition effects
SPIE-The International Society for Optical Engineering |
10
Conference Proceedings
Influence of optical nonlinearities of the photoresist on the photolithographic process:applications
SPIE-The International Society for Optical Engineering |
5
Conference Proceedings
Fundamental study of photoresist dissolution with real time spectroscopic ellipsometry and interferometry
SPIE-The International Society for Optical Engineering |
11
Conference Proceedings
Influence of optical nonlinearities of the photoresist on the photolithographic process:basics
SPIE-The International Society for Optical Engineering |
6
Conference Proceedings
Photoresist characterization for lithography simulation:IV.Processing effects on resist parameters
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |