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Surface inspection of transparent materials with a compact reflection sensor

Author(s):
  • Koscheck,M. ( Univ.-Gesamthochschule Siegen(FRG) )
  • Kleuver,W. ( Univ.-Gesamthochschule Siegen(FRG) )
  • Weber,J. ( Univ.-Gesamthochschule Siegen(FRG) )
  • Hartmann,K. ( Univ.-Gesamthochschule Siegen(FRG) )
Publication title:
Sensors, sensor systems, and sensor data processing : June 16-17 1997, Munich, FRG
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3100
Pub. Year:
1997
Page(from):
357
Page(to):
365
Pub. info.:
Bellingham, Wash., USA: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819425201 [0819425206]
Language:
English
Call no.:
P63600/3100
Type:
Conference Proceedings

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