Hoppert, Jeffrey B., Miaoulis, Ioannis N., Wong, Peter Y.
MRS - Materials Research Society
|
Lai K. C. J., Walsh M. J., Dennis C. S., Clark B. J.
PLENUM PRESS
|
Kauffman G. Erle, Sageman B. Bradley
Kluwer
|
Dainesi, P., Moselund, K., Mazza, M., Thevenaz, L., Ionescu, A.
SPIE - The International Society of Optical Engineering
|
B.M. Krooss, F. May
Springer
|
Ling, G.S.F., Riechers, R.G., Pasala, K.M., Blanchard, J., Rosner, M., Jarell, A., Yun, C., Garcia-Pinto, P., Song, …
SPIE-The International Society for Optical Engineering
|
Scott R. Baerson, Agnes M. Rimando
American Chemical Society
|
Pedersen, Sven, Jensen, Bent F., Jorgensen, Steen T.
American Chemical Society
|
Clark, Douglas S., Creagh, Louise, Skerker, Paul, Guinn, Mark, Prausnitz, John, Blanch, Harvey
American Chemical Society
|
Hertel, L. W., Kroin, J. S., Grossman, C. S., Grindey, Gerald B., Dorr, A. F., Storniolo, A. M. V., Plunkett, W., …
American Chemical Society
|
Backer A. C., Corvan R. J., Dannhauser J. T., Suddaby R. B., Takagi K., McLendon L. G., Whitten G. D.
D. Reidel
|
Kani, K.
Trans Tech Publications
|