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Multiple scattering in chiral media: border effects,reduced depolarization,and sensitivity limit

Author(s):
  • Delplancke,F. ( Univ.Libre de Bruxelles (Belgium) )
  • Badoz,J. P. ( Ecole Superieure de Physique et Chimie Industrielle (France) )
  • Boccara,A. C. ( Ecole Superieure de Physique et Chimie Industrielle (France) )
Publication title:
Polarization: measurement, analysis, and remote sensing : 30 July-1 August 1997, San Diego, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3121
Pub. Year:
1997
Page(from):
465
Page(to):
475
Pub. info.:
Bellingham, Wash.: SPIE-The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819425430 [0819425435]
Language:
English
Call no.:
P63600/3121
Type:
Conference Proceedings

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