Intensity masking to get high-resolution images from low-quality apertures

Intensity masking to get high-resolution images from low-quality apertures

Author(s):

Theiler,J. ( Los Alamos National Lab. )
Priedhorsky,W.C. ( Los Alamos National Lab. )

Publication title:

Image Reconstruction and Restoration II

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3170

Pub. Year:

1997

Page(from):

150

Page(to):

160

Pub. info.:

Bellingham, Wash.: SPIE-The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819425928 [0819425923]

Language:

English

Call no.:

P63600/3170

Type:

Conference Proceedings

Details

TDL ID:	ZA00019257
Series ID:	PA00000029
Conf. info. (Name):	Optics & Photonics : Image Reconstruction and Restoration
Conf. info. (Number):	1997 : 2nd
Conf. info. (Venue):	San Diego, CA, USA
Conf. info. (Date):	1997.07.28-1997.07.29

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