Industrial use of conductive adhesives for SMT assemblies
- Author(s):
- Perichaud,M.G. ( Univ.de Bordeaux I (France) )
- Fremont,H. ( Univ.de Bordeaux I (France) )
- Salagoity,M. ( Solectron (France) )
- Faure,C. ( Solectron (France) )
- Danto,Y. ( Univ.de Bordeaux I (France) )
- Publication title:
- Microelectronic Manufacturing Yield, Reliability, and Failure Analysis IV
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 3510
- Pub. Year:
- 1998
- Page(from):
- 104
- Page(to):
- 111
- Pub. info.:
- Bellingham, Wash.: SPIE-The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819429698 [0819429694]
- Language:
- English
- Call no.:
- P63600/3510
- Type:
- Conference Proceedings
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