Blank Cover Image

Estimation of Mark-Houwink Constants for Use in SEC Universal Calibration Procedures

Author(s):
Rudin, Alfred ( University of Waterloo )  
Publication title:
43rd Annual Technical Conference : ANTEC 85 : plastics : April 29-May 2, 1985 Sheraton Washington Hotel, Washington, D.C.
Title of ser.:
Annual Technical Conference - ANTEC : Society of Plastics Engineers Annual Technical Papers
Ser. no.:
31
Pub. Year:
1985
Pt.:
1
Page(from):
273
Page(to):
274
Pages:
2
Pub. info.:
Brookfield Center, CT: Society of Plastics Engineers, Inc. (SPE)
Language:
English
Call no.:
S42700/31
Type:
Conference Proceedings

Similar Items:

Rudin Alfred, O'Driscoll F. K., Grinshpun V., Steinberg M.

Society of Plastics Engineers, Inc. (SPE)

Lesec, James, Millequant, Michele, Havard, Trevor

American Chemical Society

Sanayei, R. Amin, O'Driscoll, K. F., Rudin, Alfred

American Chemical Society

Rudin, Alfred, Worm, Allan T., Blacklock, John E.

Society of Plastics Engineers, Inc. (SPE)

3 Conference Proceedings Control of Core-Shell Latex Morphology

Lee, S., Rudin, Alfred

American Chemical Society

Devon, Michael J., Provder, Theodore, Rudin, Alfred

American Chemical Society

Pang, Simon, Rudin, Alfred

American Chemical Society

Rudin,A.V.

SPIE-The International Society for Optical Engineering

Ajji A., Schreiber P. H., The W. J., Rudin Alfred

Society of Plastics Engineers, Inc. (SPE)

Vandezande, Gerald A., Rudin, Alfred

American Chemical Society

Rudin Alfred, Nam Sehyum, Worm T. Allan, Blacklock E. John

Society of Plastics Engineers, Inc. (SPE)

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12