Characterization and Application of Nanoscale Artifacts in Scanning Tunneling Microscopy

Characterization and Application of Nanoscale Artifacts in Scanning Tunneling Microscopy

Author(s):

Publication title:

Atomic and nanometer-scale modification of materials : fundamentals and applications

Title of ser.:

NATO ASI series. Series E, Applied sciences

Ser. no.:

239

Pub. Year:

1993

Page(from):

327

Page(to):

335

Pages:

9

Pub. info.:

Dordrecht: Kluwer Academic Publishers

ISSN:

0168132X

ISBN:

9780792323341 [0792323343]

Language:

English

Call no.:

N11482/239

Type:

Conference Proceedings

Details

TDL ID:	ZA00019172
Series ID:	PA00000018
Conf. info. (Name):	NATO Advanced Research Workshop on Atomic and Nanopmeter-Scale Modification of Materials
Conf. info. (Number):	1992
Conf. info. (Venue):	Ventura, CA, USA
Conf. info. (Date):	1992.08.16-1992.08.21

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