ion Implanted Polyparaphenylene: Modifications of Lateral and in Depth Concentration Profiles upon Anenealing
- Author(s):
Froyer. G Pelous. Y Gauneau. M Chaplain. R Moliton. A Ratier. B - Publication title:
- Conjugated polymeric materials : opportunities in electronics, optoelectronics and molecular electronics
- Title of ser.:
- NATO ASI series. Series E, Applied sciences
- Ser. no.:
- 182
- Pub. Year:
- 1990
- Page(from):
- 263
- Page(to):
- 271
- Pages:
- 9
- Pub. info.:
- Dordrecht: Kluwer Academic Publishers
- ISSN:
- 0168132X
- ISBN:
- 9780792307518 [0792307518]
- Language:
- English
- Call no.:
- N11482/182
- Type:
- Conference Proceedings
Similar Items:
1
Conference Proceedings
Depth Profiling of Al Ion-Implantation Damage in SiC Crystals by Cathodoluminescence Spectroscopy
Trans Tech Publications |
North-Holland |
MRS - Materials Research Society |
8
Conference Proceedings
Near-surface and interfacial profiling by neutron depth profiling (NDP) and secondary ion mass spectrometry (SIMS)
North-Holland |
Trans Tech Publications |
MRS - Materials Research Society |
4
Conference Proceedings
Ion Implantation into Stainless Steel-Depth Selective Phase Analysis with an Improved Mossbauer Technique
Trans Tech Publications |
North-Holland |
Trans Tech Publications |
Materials Research Society |
6
Conference Proceedings
Quantitative Depth Profiles Of Vacancy Cluster Defects Produced By MeV Ion Implantation In Si: Species And Dose Dependence
Materials Research Society |
12
Conference Proceedings
Auger Depth Profiling with Good Depth Resolution of Low Energy Implantation Induced Ion Mixing
Trans Tech Publications |