Blank Cover Image

Threshold-value Simulation and Test Generation

Author(s):
Publication title:
Testing and diagnosis of VLSI and ULSI
Title of ser.:
NATO ASI series. Series E, Applied sciences
Ser. no.:
151
Pub. Year:
1988
Page(from):
311
Page(to):
323
Pages:
13
Pub. info.:
Dordrecht: Kluwer Academic Publishers
ISSN:
0168132X
ISBN:
9789024737949 [902473794X]
Language:
English
Call no.:
N11482/151
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Statistical Testing

Agrawal D. V.

Kluwer Academic Publishers
7 Conference Proceedings Microwave Synthesis of Aligned Carbon Nanotubes in a Single Mode Cavity

J. Cheng, D. Agrawal, Y. Zhang

American Institute of Chemical Engineers
2 Conference Proceedings Hardware-in-the-loop simulation and testing of digital engine control system

Cheng, T.

SPIE-The International Society for Optical Engineering
8 Conference Proceedings The exponential fitting of optical threshold and analyses of testing errors

D. Li, J. Shan, Y. Zhao, K. Yi, H. Qi

Society of Photo-optical Instrumentation Engineers
3 Conference Proceedings Design and implementation of a new UHV threshold cathode test facility

Umstattd,R.J., Shiffler,D.A., Baca,C.A., Hendricks,K.J., Spencer,T.A., Luginsland,J.W.

SPIE - The International Society for Optical Engineering
9 Conference Proceedings Variable-threshold resist models for lithography simulation

Randall,J., Ronse,K., Marschner,T., Goethals,M., Ercken,M.

SPIE - The International Society for Optical Engineering
4 Conference Proceedings Threshold Stresses of Dislocation Generation Onset in Silicon

Peidous, I.V., Loiko, K.V., Balasubramanian, N., Schuelke, T.

Electrochemical Society
10 Conference Proceedings Scalable access within the context of digital libraries

Cheng, X., Dolin, R., Neary, M., Prabhakar, S., Ravi Kanth, K.V., Wu, D., Agrawal, D., El Abbadi, A., Freeston, M., …

IEEE Computer Society Press
5 Conference Proceedings Threshold Stresses of Dislocation Generation Onset in Silicon

Peidous,I.V., Loiko,K.V., Balasubramanian,N., Schuelke,T.

Electrochemical Society, SPIE-The International Society for Optical Engineering
11 Conference Proceedings Spectral methods for threshold Boolean filtering

J.T. Astola, K.O. Egiazarian, D.Z. Gevorkian

Society of Photo-optical Instrumentation Engineers
6 Conference Proceedings Microwave Synthesis of Aligned Carbon Nanotubes in a Single Mode Cavity

J. Cheng, D. Agrawal, Y. Zhang

American Institute of Chemical Engineers
12 Conference Proceedings Measurement of generation lifetime in partially depleted SOI MOSFETs

Shin, H C, Racanelli, M, Huang, W M, Ford, J, Foersiner, J, Shin, H, Wetteroth, T, Hong, S Q, Wilson, S R, Schroder, D …

Electrochemical Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12