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The Characterization of Interface Roughness and Other Defects in Multilayers by X-Ray Scattering

Author(s):
Sinha K. S.
Sanyal K. M.
Gibaud A.
Satija K. S.
Majkrzak F. C.
Homma H.
1 more
Publication title:
Science and technology of nanostructured magnetic materials
Title of ser.:
NATO ASI series. Series B, Physics
Ser. no.:
259
Pub. Year:
1991
Page(from):
145
Page(to):
149
Pages:
5
Pub. info.:
New York: Plenum Press
ISBN:
9780306439247 [0306439247]
Language:
English
Call no.:
N11479/259
Type:
Conference Proceedings

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