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Transmission electron microscopy and diffraction from semiconductor interfaces and surfaces

Author(s):
Gibson M. J.  
Publication title:
Surface and interface characterization by electron optical methods
Title of ser.:
NATO ASI series. Series B, Physics
Ser. no.:
191
Pub. Year:
1988
Page(from):
55
Page(to):
76
Pages:
22
Pub. info.:
New York: Plenum Press
ISBN:
9780306430862 [030643086X]
Language:
English
Call no.:
N11479/191
Type:
Conference Proceedings

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