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Accommodating multiple illumination sources in an imaging colorimetry environment

Author(s):
Tobin,K.W.,Jr. ( Oak Ridge National Lab )
Goddard,J.S.,Jr.
Hunt,M.A.
Hylton,K.W.
Karnowski,T.P.
Simpson,M.L.
Richards,R.K.
Treece,D.A.
3 more
Publication title:
Machine vision applications in industrial inspection VIII : 24-26 January 2000, San Jose, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3966
Pub. Year:
2000
Page(from):
194
Page(to):
205
Pub. info.:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819435842 [0819435848]
Language:
English
Call no.:
P63600/3966
Type:
Conference Proceedings

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