Comparison between two classification methods:application to defect detection by artificial vision in industrial field

Comparison between two classification methods:application to defect detection by artificial vision in industrial field

Author(s):

Publication title:

Machine vision applications in industrial inspection VIII : 24-26 January 2000, San Jose, California

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3966

Pub. Year:

2000

Page(from):

154

Page(to):

161

Pub. info.:

Bellingham, Wash.: SPIE - The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819435842 [0819435848]

Language:

English

Call no.:

P63600/3966

Type:

Conference Proceedings

Details

TDL ID:	ZA00019029
Series ID:	PA00000029
Conf. info. (Name):	IS&T/SPIE Electronic Imaging : Machine vision applications in industrial inspection
Conf. info. (Number):	2000 : 8th
Conf. info. (Venue):	San Jose, CA, USA
Conf. info. (Date):	2000.01.24-2000.01.26

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