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Fault detection and feature analysis in interferometric fringe patterns by the application of wavelet filters in convolution processors

Author(s):
Kruger,S. ( Humboldt-Univ.zu Berlin )
Wernicke,G.K.
Osten,W.
Kayser,D.
Demoli,N.
Gruber,H.
1 more
Publication title:
Machine vision applications in industrial inspection VIII : 24-26 January 2000, San Jose, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3966
Pub. Year:
2000
Page(from):
145
Page(to):
153
Pub. info.:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819435842 [0819435848]
Language:
English
Call no.:
P63600/3966
Type:
Conference Proceedings

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