Measurement of mounting-induced strain in high-power laser diode arrays

Measurement of mounting-induced strain in high-power laser diode arrays

Author(s):

Tomm,J.W. ( Max-Born-Institut fur Nichtlineare Optik und Kurzzeitspektroskopie )
Muller,R.
Barwolff,A.
Lorenzen,D.

Publication title:

Design, fabrication, and characterization of photonic devices : 30 November-3 December 1999, Singapore

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3896

Pub. Year:

1999

Page(from):

56

Page(to):

64

Pub. info.:

Bellingham, Wash., USA: SPIE - The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819434982 [0819434981]

Language:

English

Call no.:

P63600/3896

Type:

Conference Proceedings

Details

TDL ID:	ZA00019022
Series ID:	PA00000029
Conf. info. (Name):	International Symposium on Photonics and Applications : Design, fabrication, and characterization of photonic devices
Conf. info. (Number):	1999
Conf. info. (Venue):	Singapore
Conf. info. (Date):	1999.11.30-1999.12.03

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