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Blind deconvolution approach for resolution enhancement of near-field microwave images

Author(s):
Publication title:
Mathematical modeling, Bayesian estimation, and inverse problems : 21-23 July 1999, Denver, Colorado
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3816
Pub. Year:
1999
Page(from):
274
Page(to):
281
Pub. info.:
Bellingham, Wash., USA: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819433022 [0819433020]
Language:
English
Call no.:
P63600/3816
Type:
Conference Proceedings

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