CCD development and characterization for the GOES N and O Solar X-ray Imager

CCD development and characterization for the GOES N and O Solar X-ray Imager

Author(s):

Shing,L. ( Lockheed Martin Palo Alto Advanced Technology Ctr. )

Publication title:

EUV, x-ray, and gamma-ray instrumentation for astronomy X : 21-23 July 1999 Denver, Colorado

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3765

Pub. Year:

1999

Page(from):

299

Page(to):

311

Pub. info.:

Bellingham, Wash.: SPIE - The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819432513 [0819432512]

Language:

English

Call no.:

P63600/3765

Type:

Conference Proceedings

Details

TDL ID:	ZA00019010
Series ID:	PA00000029
Conf. info. (Name):	Optics & Photonics : EUV, x-ray, and gamma-ray instrumentation for astronomy
Conf. info. (Number):	1999 : 10th
Conf. info. (Venue):	Denver, CO, USA
Conf. info. (Date):	1999.07.21-1999.07.23

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