Blank Cover Image

Method of searching segmentation parameters applied to quality control of industrial pieces

Author(s):
Publication title:
Machine vision applications in industrial inspection VII : 25-26 January 1999, San Jose, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3652
Pub. Year:
1999
Page(from):
70
Page(to):
77
Pub. info.:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819431233 [0819431230]
Language:
English
Call no.:
P63600/3652
Type:
Conference Proceedings

Similar Items:

Geveaux, P., Kohler, S., Miteran, J., Truchetet, F.

SPIE

J.-P. Chambard, V. Chalvidan, M. Tazeroualti, F. Larue, J.-M. Dischler, V. Vurpillot, A. Legrand

SPIE - The International Society of Optical Engineering

Geveaux,P., Kohler,S., Miteran,J., Truchetet,F., Meriaudeau,F.

SPIE - The International Society for Optical Engineering

Meriaudeau, F., Truchetet, F., Laligant, O., Bourgeat, P.

SPIE - The International Society of Optical Engineering

Kohler,S., Geveaux,P., Miteran,J.

SPIE-The International Society for Optical Engineering

Nicolier,F., Laligant,O., Truchetet,F., Legrand,A.-C., Kohler,S.

SPIE - The International Society for Optical Engineering

4 Conference Proceedings Frame of wavelets for edge detection

F. Truchetet, O. Laligant, E. Bourenanne, J. Miteran

Society of Photo-optical Instrumentation Engineers

Vioix, J.-B., Douzals, J.-P., Truchetet, F.

SPIE - The International Society of Optical Engineering

Bouillant, S., Miteran, J., Paindavoine, M., Meriaudeau, F.

SPIE - The International Society of Optical Engineering

Renier,E., Suzeau,P., Truchetet,F.

SPIE-The International Society for Optical Engineering

Bouillant, S., Miteran, J., Paindavoine, M., Bourennane, E., Bourgeat, P.T.

SPIE-The International Society for Optical Engineering

Bossu, J, Gee, C, Guillemin, J P, Truchetet, F

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12