IR-based system for short-circuit detection during copper electrorefining process

IR-based system for short-circuit detection during copper electrorefining process

Author(s):

Makipaa,E. ( Tampere Univ.of Technology )
Tanttu,J.T.
Virtanen,H.

Publication title:

Machine vision applications in industrial inspection VII : 25-26 January 1999, San Jose, California

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

3652

Pub. Year:

1999

Page(from):

2

Page(to):

9

Pub. info.:

Bellingham, Wash.: SPIE - The International Society for Optical Engineering

ISSN:

0277786X

ISBN:

9780819431233 [0819431230]

Language:

English

Call no.:

P63600/3652

Type:

Conference Proceedings

Details

TDL ID:	ZA00019000
Series ID:	PA00000029
Conf. info. (Name):	IS&T/SPIE Electronic Imaging : Machine Vision Applications in Industrial Inspection
Conf. info. (Number):	1999 : 7th
Conf. info. (Venue):	San Jose, CA, USA
Conf. info. (Date):	1999.01.25-1999.01.26

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