Optical figure testing by scanning deflectometry
- Author(s):
- van Amstel,W.D. ( Philips Ctr.for Manufacturing Technology )
- Baumer,S.M.B.
- Horijon,J.L.
- Publication title:
- Optical fabrication and testing : 26-28 May 1999, Berlin, Germany
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 3739
- Pub. Year:
- 1999
- Page(from):
- 283
- Page(to):
- 290
- Pub. info.:
- Bellingham, WA: SPIE - The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819432131 [081943213X]
- Language:
- English
- Call no.:
- P63600/3739
- Type:
- Conference Proceedings
Similar Items:
SPIE - The International Society for Optical Engineering |
7
Conference Proceedings
A fast optical scanning deflectometer for measuring the topography of large silicon wafers
SPIE - The International Society of Optical Engineering |
2
Conference Proceedings
Optical testing of long cylindrical lenses by means of scanning deflectometry
SPIE-The International Society for Optical Engineering |
8
Conference Proceedings
A large-aperture high-energy laser system for optics and optical component testing
SPIE - The International Society of Optical Engineering |
SPIE - The International Society for Optical Engineering |
9
Conference Proceedings
Imaging the past: archaeological radar stratigraphic analysis at Mahram Bilqis
SPIE-The International Society for Optical Engineering |
4
Conference Proceedings
Optical system of an industrial 3D laser scanner for solder paste inspection
Society of Photo-optical Instrumentation Engineers |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
Society of Photo-optical Instrumentation Engineers |