Blank Cover Image

Modeling and design of multiple buried junctions detectors for color systems development

Author(s):
Alexandre,A. ( Univ.Pierre et Marie Curie )
Sou,G.
Chouikha,M.Ben
Sedjil,M.
Lu,G.N.
Alquie,G.
1 more
Publication title:
Design, Test, Integration, and Packaging of MEMS/MOEMS : 9-11 May 2000, Paris, France
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4019
Pub. Year:
2000
Page(from):
288
Page(to):
298
Pub. info.:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819436450 [0819436453]
Language:
English
Call no.:
P63600/4019
Type:
Conference Proceedings

Similar Items:

Alexandre,A., Sedjil,M., Chouikha,M.Ben, Alquie,G.

SPIE-The International Society for Optical Engineering

Chouikha, M. Ben, Lu, G.N., Sedjil, M., Sou, G.

SPIE

Lu,G.N., Sou,G., Chouikha,M.Ben, Sedjil,M.

SPIE - The International Society for Optical Engineering

Alexandre,A., Lu,G.N., Sedjil,M.

SPIE - The International Society for Optical Engineering

Sedjil,M., Lu,G.N., Chouikha,M.Ben, Alexandre,A.

SPIE - The International Society for Optical Engineering

Chouikha, Mohamed Ben, Vienot, Francoise, Lu, G.N.

SPIE

Ben Chouikha,M., Lu,G.N., Sedjil,M., Sou,G., Alquie,G.

SPIE-The International Society for Optical Engineering

Haned, F., Ben Chouikha, M., Baguenier Desormeaux, A., Alquie, G.

SPIE - The International Society of Optical Engineering

Lu,G.N., Ben Chouikha,M., Sedjil,M., Sou,G., Alquie,G., Rigo,S.

SPIE-The International Society for Optical Engineering

Ben Chouikha,M., Vienot,F., Lu,G.N.

SPIE-The International Society for Optical Engineering

Chouikha,M.Ben, Lu,G.N., Sedjil,M., Sou,G.

SPIE-The International Society for Optical Engineering

Sou, G., Lu, G. N.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12