MEMS IC test probe utilizing fritting contacts
- Author(s):
Itoh,T. ( Univ.of Tokyo ) Kataoka,K. Engelmann,G. Wolf,J. Ehrmann,O. Reichl,H. Suga,T. - Publication title:
- Design, Test, Integration, and Packaging of MEMS/MOEMS : 9-11 May 2000, Paris, France
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 4019
- Pub. Year:
- 2000
- Page(from):
- 244
- Page(to):
- 249
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819436450 [0819436453]
- Language:
- English
- Call no.:
- P63600/4019
- Type:
- Conference Proceedings
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