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MEMS IC test probe utilizing fritting contacts

Author(s):
Itoh,T. ( Univ.of Tokyo )
Kataoka,K.
Engelmann,G.
Wolf,J.
Ehrmann,O.
Reichl,H.
Suga,T.
2 more
Publication title:
Design, Test, Integration, and Packaging of MEMS/MOEMS : 9-11 May 2000, Paris, France
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4019
Pub. Year:
2000
Page(from):
244
Page(to):
249
Pub. info.:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819436450 [0819436453]
Language:
English
Call no.:
P63600/4019
Type:
Conference Proceedings

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