Blank Cover Image

Moving from analysis to design:a MEMS CAD tool evolution

Author(s):
Publication title:
Design, Test, Integration, and Packaging of MEMS/MOEMS : 9-11 May 2000, Paris, France
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4019
Pub. Year:
2000
Page(from):
188
Page(to):
192
Pub. info.:
Bellingham, Wash.: SPIE - The International Society for Optical Engineering
ISSN:
0277786X
ISBN:
9780819436450 [0819436453]
Language:
English
Call no.:
P63600/4019
Type:
Conference Proceedings

Similar Items:

Nguyen,L., Lee,H.J., Maher,M.A., Xu,Y.

SPIE - The International Society for Optical Engineering

Schmidt, T., Wagener, A., Popp, J., Hahn, K., Bruck, R.

SPIE - The International Society of Optical Engineering

Liateni,K., Moulinier,D., Affour,B., Boutamine,H., Karam,J.M., Veychard,D., Courtois,B., Cao,A.D.

SPIE - The International Society for Optical Engineering

Poppe,A., Rencz,M., Szekely,V., Karam,J.-M., Courtois,B., Hofmann,K., Glesner,M.

SPIE-The International Society for Optical Engineering

Maher,M.A., Lee.H.J

SPIE-The International Society for Optical Engineering

Nguyen,Linh M., Maher,M.A.

IMAPS

Karam,J.M.

SPIE-The International Society for Optical Engineering

Lee, S.H., Kim, J.D., Lee, H.-S., Moon, I.-K., Won, J.H., Ku, J.N., Choi, H., Shin, H.J.

SPIE-The International Society for Optical Engineering

Goy,J., Courtois,B., Karam,J.M., Pressecq,F.

SPIE - The International Society for Optical Engineering

Ribas,R.P., Veychard,D., Karam,J.M., Courtois,B.

SPIE - The International Society for Optical Engineering

Boutamine,H., Karam,J.M., Courtois,B., Drake,P., Oudinot,J., El Tahawi,H., Cao,A., Rencz,M., Poppe,A., Szekely,V.

SPIE-The International Society for Optical Engineering

Xu,J.M., Ellis,D.S.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12