Polymers for 157-nm photoresist applications:a progress report
- Author(s):
Patterson,K. ( Univ.of Texas at Austin ) Yamachika,M. Hung,R. Brodsky,C.J. Yamada,S. Somervell,M.H. Osborn,B. Hall,D. Dukovic,G. Byers,J.D. Conley,W.E. Willson,C.G. - Publication title:
- Advances in resist technology and processing XVII : 28 February - 1 March 2000, Santa Clara, USA
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 3999
- Pub. Year:
- 2000
- Vol.:
- Part1
- Page(from):
- 365
- Page(to):
- 374
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819436177 [0819436178]
- Language:
- English
- Call no.:
- P63600/3999
- Type:
- Conference Proceedings
Similar Items:
SPIE-The International Society for Optical Engineering |
7
Conference Proceedings
Improving the performance of 193-nm photoresists based on alicyclic polymers
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
3
Conference Proceedings
Using alicyclic polymers in top surface imaging systems to reduce line-edge roughness
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
4
Conference Proceedings
Positive- and negative-tone water-processable photoresists: a progress report
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
5
Conference Proceedings
Advances in TFE-based fluoropolymers for 157-nm lithography: a progress report
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |