Prospects for using existing resists for evaluating 157-nm imaging systems
- Author(s):
Fedynyshyn,T.H. ( MIT Lincoln Lab. ) Kunz,R.R. Doran,S.P. Goodman,R.B. Lind,M.L. Curtin,J.E. - Publication title:
- Advances in resist technology and processing XVII : 28 February - 1 March 2000, Santa Clara, USA
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 3999
- Pub. Year:
- 2000
- Vol.:
- Part1
- Page(from):
- 335
- Page(to):
- 346
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society for Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819436177 [0819436178]
- Language:
- English
- Call no.:
- P63600/3999
- Type:
- Conference Proceedings
Similar Items:
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
11
Conference Proceedings
Performance of a phase-shift focus monitor reticle designed for 193-nm use
SPIE - The International Society for Optical Engineering |
American Chemical Society |
SPIE - The International Society for Optical Engineering |