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DEPTH PROFILING OF MOLYBDENUM THIN FILMS USING GRAZING INCIDENCE X-RAY SCATTERING

Author(s):
Malhotra, Sandra G.
Rek, Z.
Vill, M.
Karpenko, O. P.
Yalisove, S. M.
Bilello, J. C.
1 more
Publication title:
Mechanisms of thin film evolution
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
317
Pub. Year:
1994
Page(from):
473
Pub. info.:
Pittsburgh, PA: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558992160 [1558992162]
Language:
English
Call no.:
M23500/317
Type:
Conference Proceedings

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