Blank Cover Image

EVOLUTION OF SURFACE ROUGHNESS OF A STRAINED EPITAXIAL FILM DUE TO INTERFACE MISFIT DISLOCATIONS

Author(s):
Publication title:
Mechanisms of thin film evolution
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
317
Pub. Year:
1994
Page(from):
309
Pub. info.:
Pittsburgh, PA: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558992160 [1558992162]
Language:
English
Call no.:
M23500/317
Type:
Conference Proceedings

Similar Items:

Jonsdottir, F., Freund, L. B.

MRS - Materials Research Society

Kuronen, A., Kaski, K., Perondi, L. F., Rintala, J.

Materials Research Society

Kukta, R. V., Freund, L. B.

MRS - Materials Research Society

Freund, L.B., Ramirez, J.C., Bower, A.F.

Materials Research Society

Hull, R., Bean, J. C., Ross, F., Bahnck, D., Peticolas, L. J.

Materials Research Society

Freund, L. B., Beltz, G. E., Jonsdottir, F.

MRS - Materials Research Society

10 Conference Proceedings DISLOCATION EMISSION AT SURFACES

Beltz, G. E., Freund, L. B.

MRS - Materials Research Society

Kukta, R. V., Freund, L. B.

MRS - Materials Research Society

Freund, L. B.

MRS - Materials Research Society

Beltz, G. E., Freund, L. B.

MRS - Materials Research Society

Freund, L. B.

MRS - Materials Research Society

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12