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Specular and Off-Specular X-ray Scattering as Quantitative Structural Probes of Multilayers. Application to Mn/Ir(111) Superlattices

Author(s):
Fischer, H. M.
Fischer, H. E.
Bessiere, M.
Bobo, J. -F.
Lenoble, O.
Andrieu, S.
Piecuch, M.
2 more
Publication title:
Structure and properties of multilayered thin films : symposium held April 17-19, 1995, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
382
Pub. Year:
1995
Page(from):
339
Pub. info.:
Pittsburgh, Pa.: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558992856 [1558992855]
Language:
English
Call no.:
M23500/382
Type:
Conference Proceedings

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