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An In Situ High Voltage Electron Microscopy Technique for the Study of Deformation and Fracture: In Multilayered Materials

Author(s):
Publication title:
Structure and properties of multilayered thin films : symposium held April 17-19, 1995, San Francisco, California, U.S.A.
Title of ser.:
Materials Research Society symposium proceedings
Ser. no.:
382
Pub. Year:
1995
Page(from):
321
Pub. info.:
Pittsburgh, Pa.: MRS - Materials Research Society
ISSN:
02729172
ISBN:
9781558992856 [1558992855]
Language:
English
Call no.:
M23500/382
Type:
Conference Proceedings

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